Experimental comparison of voltage and current source gate drivers for IGBTs

Lüdecke, Christoph; Engelmann, Georges; Oberdieck, Karl; Bündgen, David; de Doncker, Rik W.

Piscataway, NJ : IEEE (2017, 2018)
Buchbeitrag, Beitrag zu einem Tagungsband

In: 2017 IEEE 12th International Conference on Power Electronics and Drive Systems (IEEE PEDS 2017) : Hawaii Convention Center, Honolulu, Hawaii, USA, 12-15 December 2017 / PEDS, IEEE, PELS - IEEE Power Electronics Society, IAS - IEEE Industry Applications Society, University of Hawaii, Hawaii Tourism Authority
Seite(n)/Artikel-Nr.: 460-466

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