Comparison of Fast and Reliable Zero-Voltage Detection Topologies
New York, NY / IEEE (2020) [Journal Article]
IEEE transactions on industry applications : IA
Volume: 56
Issue: 5
Page(s): 5212-5221
Authors
Authors
Beushausen, Steffen
Krolzik, Jonas
Joebges, Philipp
Voss, Johannes
de Doncker, Rik W.
Identifier
- DOI: 10.1109/TIA.2020.3006817
- REPORT NUMBER: RWTH-2020-09086