Semiconductor Temperature and Condition Monitoring Using Gate-Driver-Integrated Inverter Output Voltage Measurement
New York, NY / IEEE (2020) [Journal Article]
IEEE transactions on industry applications
Volume: 56
Issue: 3
Page(s): 2894-2902
Authors
Authors
Schubert, Michael
de Doncker, Rik W.
Identifier
- DOI: 10.1109/TIA.2020.2977875
- REPORT NUMBER: RWTH-2020-09132