Hysteresis Losses in the Output Capacitance of Wide Bandgap and Superjunction Transistors

Bura, Dennis (Corresponding author); Plum, Thomas; Baringhaus, Jens; de Doncker, Rik W.

Piscataway, NJ : IEEE (2018)
Buchbeitrag, Beitrag zu einem Tagungsband

In: 2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe) : 17-21 Sept. 2018 / [EPE ECCE Europe conference organization: EPE Association - the European Power Electronics and Drives Association]

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