Real-Time, In Situ Degradation Monitoring in Power Semiconductor Converters

Piscataway, NJ] / IEEE (2019) [Contribution to a book, Contribution to a conference proceedings]

APEC 2019 : Thirty-Fourth Annual IEEE Applied Power Electronics Conference : March 17-21, 2019, Anaheim, California / the sponsors: Power Sources Manufacturers Association, IEEE Power Electronics Society, IEEE Industry Applications Society
Page(s): 2720-2727

Authors

Authors

Polom, Timothy A.
van der Broeck, Christoph Henrik
de Doncker, Rik W.
Lorenz, Robert D.

Identifier