Closed-Loop dv/dt Control of SiC MOSFETs Yielding Minimal Losses and Machine Degradation

(2020) [Contribution to a conference proceedings]

[IEEE Transportation Electrification Conference and Expo, ITEC]

Authors

Authors

Laumen, Michael
Kragl, Robert
Lüdecke, Christoph
de Doncker, Rik W.

Identifier

  • REPORT NUMBER: RWTH-2020-05940