Toward an In-Depth Understanding of the Commutation Processes in a SiC mosfet Switching Cell Including Parasitic Elements

New York, NY / IEEE (2020) [Journal Article]

IEEE transactions on industry applications
Volume: 56
Issue: 4
Page(s): 4089-4101

Authors

Selected Authors

Fritz, Niklas
Engelmann, Georges
Stippich, Alexander
Ludecke, Christoph
Philipps, Daniel A.

Other Authors

De Doncker, Rik W.

Identifier