Comparison of Fast and Reliable Zero-Voltage Detection Topologies

Beushausen, Steffen (Corresponding author); Krolzik, Jonas; Joebges, Philipp; Voss, Johannes; de Doncker, Rik W.

New York, NY / IEEE (2020) [Journal Article]

IEEE transactions on industry applications : IA
Volume: 56
Issue: 5
Page(s): 5212-5221