Comparison of Fast and Reliable Zero-Voltage Detection Topologies

New York, NY / IEEE (2020) [Journal Article]

IEEE transactions on industry applications : IA
Volume: 56
Issue: 5
Page(s): 5212-5221

Authors

Authors

Beushausen, Steffen
Krolzik, Jonas
Joebges, Philipp
Voss, Johannes
de Doncker, Rik W.

Identifier