Fault Seal

Amsterdam / Elsevier (2020) [Contribution to a book]

Understanding faults : detecting, dating, and modeling / Tanner, David ; Brandes, Christian , Amsterdam : Elsevier, [2020],
Page(s): xiii, 366 Seiten : Illustrationen, Diagramme

Authors

Selected Authors

Tanner, David
Brandes, Christian
Kettermann, Michael
Smeraglia, Luca
Morley, Chris

Other Authors

von Hagke, Christoph

Identifier

  • REPORT NUMBER: RWTH-2020-10556